Products Description
The XW-ET35 series LCR digital bridge is a high-precision component parameter analyzer that uses the principle of automatic balanced bridge. It has a testing bandwidth of 10Hz to 1MHz, continuously adjustable frequency, basic measurement accuracy of 0.05%, automatic level control, list scanning, and position counting functions. It can provide accurate and complete measurement and analysis for the vast majority of components and materials, and is widely used in product development, component procurement inspection, and online product sorting.
Technical Parameters
| Product features： |
| 0.05% basic accuracy |
| A maximum of 200 time/s measuring speed |
| Frequency measurement range of 10 Hz- 1 MHz,Continuous adjustable, 1 mHZ step by step |
| Amplitude of excitation signal 10 mV～2 V adjustable,1mV step by step |
| Internal programmable DC bias voltage -2V~+2V |
| Support external dc bias voltage applied -60V~+60V |
| Support external current source |
| V,I testing signal monitoring |
| 10-point list scanning testing |
| 10-grade sorting and counting |
| 100 groups of correcting data for specified frequencies |
| Automatic range , manual range |
| 7” LED display screen, Chinese and English interfaces |
| USB, Ethernet, RS232, GPIB, Handler interfaces |
| Measured objects： |
| Passive components: impedance parameter evaluation and performance analysis for capacitors, inductors, magnetic cores, resistors, piezoelectric devices, transformers, chip components and network components. |
| Semiconductor components: C-VDC characteristics of varactors; analysis of parasitic parameters transistors and integrated circuits |
| Other components: impedance evaluation of printed-circuit boards, relays, switches, cables, batteries, etc. |
| Dielectric materials: dielectric constants and loss angle of plastic, ceramic and other materials; |
| Magnetic materials: evaluation of magnetic permeability and loss angle of ferrite, amorphous bodies, and other magnetic materials |
| Semiconductor materials: dielectric constant, electric conductivity and C-V characteristic of semiconductor materials |
| Liquid crystal materials: dielectric constant, elastic constant and other C-V characteristic of liquid crystal unit |
| Applications: |
| Electronic capacitors, substrates, PCB, antennae, ferrite, dampers, SAR phantom materials |
| Aerospace/national defense, stealth technology, RAM (radar-absorbent materials), radar antenna housing |
| Industrial materials, ceramic and composite materials, auto parts, coating |
| Polymers, plastic fibers, films, insulating materials |
| Hydrogel, disposable diapers, soft contact lens |
| Liquid crystal display |
| Other products containing such materials: tires, paints, adhesives |
| Food and agriculture: food preservation (deterioration) study, development of microwave food, package and water content measurement |
| Forestry and mining: water content measurement and oil content analysis of wood/paper products |
| Pharmacy and medicine: R&D and production of drugs, biological implant, human tissue characterization, biomass and fermentation |
| General technical specifications: |
| Power voltage: 220V.AC/50Hz ±10%, |
| Power consumption: <20W |
| Display: 7” TFT LCD, resolution 800*480 |
| Interfaces: LAN, RS232, GPIB, USB Host,USB Device and Handler |
| Service environment: 0°C-40°C |
| Sizes: 330mm*285mm*136mm (L*W*H) |
| Weight: 3.6 kg |
| Model | XW-ET3510 | XW-ET3505 | XW-ET3503 | XW-ET3502 | XW-ET3501 |
| Test signal frequency range | 10Hz-1MHz | 10Hz-500kHz | 10Hz-300kHz | 10Hz-200kHz | 10Hz-100kHz |
| Frequency resolution 、accuracy | Resolution:1mHz，Accuracy:0.01% | ||||
| Test parameters | Cp-D，Cp-Q，Cp-G，Cp-Rp，Cs-D，Cs-Q，Cs-Rs， | ||||
| Lp-D，Lp-Q，Lp-G，Lp-Rp，Ls-D，Ls-Q，Ls-Rs， | |||||
| Rs-Xs，|Z|-θr，|Z|-θd，|Y|-θr，|Y|-θd，G-B | |||||
| Measuring display speed | Fast:50times/s（20ms ），Medium:10times/s（100ms ），Slow:1.25times/s（800ms ） | ||||
| Custom measuring speed | Between 0.5times/s～200times/s,Can be set | ||||
| LCR parameter range | Cp、Cs：0.001000pF~99.9999F | ||||
| Lp、Ls：0.001000nH~99.9999kH | |||||
| Rp、Rs、|Z|、Xs：0.001000mΩ~999.999MΩ | |||||
| G、B、|Y|：0.001000μS~999.999kS | |||||
| θr：±0.000001rad~3.14159rad | |||||
| θd：±0.000001deg~179.9999deg | |||||
| D：±0.000001~9.99999 | |||||
| Q：±0.001~99999.9 | |||||
| Test signal voltage range | 0～2Vrms | ||||
| Voltage resolution、accuracy | Resolution:1mV，accuracy:5%+5mV | ||||
| Test signal current range | 100μArms～20mArms | ||||
| Current resolution、accuracy | Resolution:10μA，accuracy:5%+50μA | ||||
| DC bias voltage source | Internal：-2V～+2V voltage bias，-20mA～+20mA current bias | ||||
| External ：-60V～+60V voltage bias | |||||
| Internal resistance of signal source | 30 Ohm or 100 Ohm, selectable | ||||
| Basic accuracy | 0.05% | ||||
| Display resolution | 6 1/2 digit | ||||
| Comparator | 9 groups of qualified setting, one group of unqualified setting, one group of auxiliary setting | ||||
| Triggered mode | Internal,External,manual, bus | ||||
| Mathematical operations | Delta（absolute value），Delta%（percentage），Direct reading | ||||
| Calibration function | Self-calibration, open circuit,short circuit,load,100 groups of customised frequency point | ||||
| List scanning | 10-point list scanning testing | ||||
| Storage device | Internal/USB storage device | ||||
| Interface | GPIB、LAN、RS232、USB Host、USB Device、Handler | ||||
