Products Description
High and low temperature test chamber for electrical, electronic, instrumentation, automotive electronics, electronic components, materials and other products, storage and use of high and low temperature environmental conditions adaptable, suitable for schools, factories, military, scientific research and other units, in the high temperature detection of a variety of electronic components, low temperature, high and low temperature alternating environment, a variety of performance indicators
Technical Parameters
| Model | High and Low Temperature Alternating Test Chamber XW-GD4005 |
| Working chamber size | 350mm*360mm*400mm |
| (D*W*H) | |
| Dimension | 890mm*890mm*1610mm |
| (D*W*H) | |
| Temperature range | -40℃-150℃ |
| Temperature fluctuations | ±0.5℃ |
| Temperature uniformity | ≤±2℃ |
| Heating up time | 3-5℃/min |
| Cooling time | 0.7-1℃/min |
| Power | 3.8kw |
| Voltage | AC110V/220V with grounding protect |
| Advantages | 1 Screen simple operation, easy to edit program, no key presses. |
| 2 With 99 groups, 24 section, 99cycles of program capacity, | |
| each step with time setting up to 99 hours and 59 minutes. | |
| 3 Heating, cooling and totally independent, can improve the efficiency and reduce the test cost, | |
| increase longevity, reduce the failure rate |
