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Surface Area Analyzer With Surface area ≥ 0.01m2/g

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Surface Area Analyzer With Surface area ≥ 0.01m2/g

Item No.: XW-JW-DX
Application: It can measure the resistivity of any semiconductor powder material.
Warranty: One Year warranty with lifetime support;
Order(MOQ): 1 set;
Payment: T/T,Western Union, Paypal,L/C;
Product Origin: China;
Lead Time: in stock or 1-10days,ect;
Note: XIAOWEI factory supports OEM.

 Products Description 

Low-Temperature Nitrogen Adsorption Analyzer — Technical Specifications
Power Supply
Voltage: 100V–220V ± 10V

Frequency: 50/60 Hz

Maximum Power Consumption: 300 W

Connection Type: Grounded single-phase socket

Physical Properties
Dimensions:

Length: 61 cm (24.0 inches)

Width: 36 cm (14.2 inches)

Height: 69 cm (27.2 inches)

Net Weight: 49 kg (108.0 lbs)

Accessories Weight: 31 kg (68.3 lbs)

Installation Space Requirement: 100 cm × 60 cm (excluding computer area)

Working Environment
Operating Temperature: 20°C – 28°C

Maximum Relative Humidity: 70%

 Technical Parameters

Technical Parameters
Test Principle: Continuous Flow Chromatography Method; Low-Temperature Nitrogen Adsorption

Test Method: Direct Comparison Method

Gas Supply
Gas Composition: High-purity mixed gas (Nitrogen:Helium = 3:7)

Gas Purity: ≥ 99.999%

Flow Control
Method: Automated control

P/Po Range: 0.05 – 0.35

Control Accuracy Error: ≤ ±0.5%

Measurement Capabilities
Surface Area Range: ≥ 0.01 m²/g, no upper limit

Repeatability Accuracy: ≤ ±1.0%

Sample Capacity: 1 standard sample + 3 test samples

Test Efficiency: Direct comparison method – ~15 minutes for 3 samples

System & Software
Data Acquisition: High-precision chips with strong anti-interference capabilities

Software Platform:

Windows-compatible, no installation required

Multi-mode data analysis

Graphical interface

Real-time experimental monitoring

Simple and intuitive operation

Control System:

Fully automated testing process

Equipped with a large-volume Dewar flask and liquid nitrogen level control technology

No need to manually refill liquid nitrogen during the test

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